ニュース＆トピックス
セミナーのお知らせ: Arnaud Arbouet 氏 (Research director, CNRS)
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日時：２０２６年７月２９日（水）15:00～16:30
場所：東京大学理学部1号館3階337A号室 および ZOOM（どちらも事前登録制）
講演者：Arnaud Arbouet氏
(Research director, CNRS)
講演題目:Generation and control of ultrashort electron pulses with light: application to the study of the ultrafast dynamics of materials
Abstract
Studying the ultrafast dynamics of nanomaterials necessitates spatio-temporal resolutions in the nanometer and femtosecond range. While far-field optical techniques can achieve femtosecond temporal resolution, their spatial resolution is fundamentally limited to the hundreds of nanometers range. To surpass this limitation, electromagnetic waves with shorter wavelengths or alternative probes must be employed.
In this context, accelerated electron beams offer several advantages. Their associated De Broglie wavelength, in the picometer range, provides atomic resolution. Additionally, their strong interaction with matter generates a wealth of secondary signals, revealing the physical, structural, and chemical properties of a sample with atomic precision. Ultrafast Electron Diffraction (UED) setups and Ultrafast Transmission Electron Microscopes (UTEMs) are prominent examples that enable studies at ultimate spatio-temporal resolutions [1,2].
In this talk, I will first discuss the development of two generations of high-brightness UTEMs, based on a high-coherence source of femtosecond electron pulses. The properties of their ultrafast electron beams have enabled several applications, such as the acquisition of electron holograms with femtosecond electron pulses [2,3] and the measurement of excited state lifetimes in semiconductors with sub-wavelength spatial resolution [4].
Beyond UTEMs, I will discuss how the generation and control of ultrashort electron pulses using femtosecond laser pulses open immense possibilities for studying the ultrafast dynamics of nanomaterials on ultimate spatio-temporal scales.
References:
[1] Arbouet et al., Advances in Imaging and Electron Physics, 207, 2018.
[2] Houdellier et al., Ultramicroscopy, 186, 2018.
[3] Houdellier et al., Ultramicroscopy, 202, 2019.
[4] Meuret et al., Applied Physics Letters, 119, 2021.
使用言語：English/英語
紹介教員：小西 邦昭
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